发明名称 System to estimate X-ray scatter
摘要 <p>A system may include determination (S210) of a first scatter kernel (410) based on a first energy, a material-equivalent radiological thickness and a first diameter, wherein the first scatter kernel is not a monotonically decreasing function of radial coordinate, determination (S220) of a second scatter kernel (420) based on the first energy, the material-equivalent radiological thickness and a second diameter greater than the first diameter, determination (S230) of a third scatter kernel (430) based on the first scatter kernel and the second scatter kernel, wherein the third scatter kernel is a monotonically decreasing function of radial coordinate, and estimation (S240) of scatter radiation within the projection image of the object based on the third scatter kernel. </p>
申请公布号 EP2157548(A3) 申请公布日期 2011.03.09
申请号 EP20090167639 申请日期 2009.08.11
申请人 SIEMENS MEDICAL SOLUTIONS USA, INC. 发明人 MALTZ, JONATHAN S.
分类号 G06T11/00 主分类号 G06T11/00
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