发明名称 Method and microscope for high spatial resolution examination of samples
摘要 A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in such a way that a standing wave with defined intensity zero points (5) is formed in the sample region (P) to be recorded.
申请公布号 US7903247(B2) 申请公布日期 2011.03.08
申请号 US20090543904 申请日期 2009.08.19
申请人 LEICA MICROSYSTEMS CMS GMBH 发明人 DYBA MARCUS;GUGEL HILMAR
分类号 G01J3/30 主分类号 G01J3/30
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