| 摘要 |
In the present invention, an inspection area for sampled defect data is set which has a predetermined width in the radial direction of a magnetic disk and a length round the circle of the magnetic disk in the circumferential direction thereof or a predetermined length in the circumferential direction thereof, and while limiting the defect data in the inspection area and shifting a narrow and long search frame within the area, continuing defects in the region of the search frame are followed up and detected, thereby, only curved line shaped continuing defects having comparatively large curvature near to the circle of the magnetic disk are selectively detected and acquired as circle shaped defects.
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