发明名称 METHOD FOR FABRICATING A THROUGH INTERCONNECT ON A SEMICONDUCTOR SUBSTRATE
摘要 <p>A method for fabricating a through interconnect on a semiconductor substrate includes the steps of forming a via on a first side of the substrate part way through the substrate, forming an electrically insulating layer on the first side and in the via, forming an electrically conductive layer at least partially lining the via, forming a first contact on the conductive layer in the via, and thinning the substrate from a second side at least to the insulating layer in the via. The method can also include the step of forming a second contact on a second side of the substrate in electrical contact with the first contact. The method can be performed on a semiconductor wafer to form a wafer scale interconnect component. In addition, the interconnect component can be used to construct semiconductor systems such as a light emitting diode (LED) systems.</p>
申请公布号 WO2011024045(A1) 申请公布日期 2011.03.03
申请号 WO2010IB02042 申请日期 2010.08.18
申请人 SEMILEDS OPTOELECTRONICS CO., LTD. 发明人 CHU, CHEN FU
分类号 H01L23/52;H01L21/44;H01L23/48 主分类号 H01L23/52
代理机构 代理人
主权项
地址