发明名称 SEMICONDUCTOR STRUCTURE AND METHOD
摘要 A method for forming a structure on a surface of a semiconductor. The method includes: forming the material as a lower layer of the structure using a first deposition process to provide the lower layer with a first etch rate to a predetermined etchant; forming the upper layer of the structure with the material on the lower using a second deposition process to provide the upper layer with a second etch rate to the predetermined etchant higher than the first etch rate; and applying the predetermined etchant to upper layer to selectively remove the upper while leaving the lower layer.
申请公布号 US2011049581(A1) 申请公布日期 2011.03.03
申请号 US20090553249 申请日期 2009.09.03
申请人 RAYTHEON COMPANY 发明人 CHUMBES EDUARDO M.;HOKE WILLIAM E.;IP KELLY P.;SHAW DALE M.;BRIERLEY STEVEN K.
分类号 H01L27/06;H01L21/02;H01L21/302;H01L21/31;H01L29/38 主分类号 H01L27/06
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