发明名称 Contact scheme for MOSFETs
摘要 A semiconductor structure and methods of forming the same are provided. The semiconductor structure includes a semiconductor substrate; a first inter-layer dielectric (ILD) over the semiconductor substrate; a contact extending from a top surface of the first ILD into the first ILD; a second ILD over the first ILD; a bottom inter-metal dielectric (IMD) over the second ILD; and a dual damascene structure comprising a metal line in the IMD and a via in the second ILD, wherein the via is connected to the contact.
申请公布号 US7898037(B2) 申请公布日期 2011.03.01
申请号 US20070833128 申请日期 2007.08.02
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHUANG HARRY;THEI KONG-BENG;LIANG MONG SONG;KAO JUNG-HUI;CHUNG SHENG-CHEN;CHENG CHUNG LONG;LIAO SHUN-JANG
分类号 H01L29/78 主分类号 H01L29/78
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