发明名称 |
Enabling test modes of individual integrated circuit devices out of a plurality of integrated circuit devices |
摘要 |
Methods and apparatus are provided. A common test-mode enable signal is received at two or more integrated circuit devices of an electronic system. A test mode of only an integrated circuit device of the two or more integrated circuit devices that was last to receive a valid command is enabled in response to the common test-mode enable signal.
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申请公布号 |
US7900099(B2) |
申请公布日期 |
2011.03.01 |
申请号 |
US20050043011 |
申请日期 |
2005.01.25 |
申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
WAN JUDY;LOUIE BENJAMIN |
分类号 |
G11C29/00;G01R31/26;G01R31/28 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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