APPARATUS AND METHOD FOR INSPECTING A CAPACITIVE TOUCH SCREEN PANEL USING LC RESONANT FREQUENCY VARIATION

摘要

The present invention relates to an apparatus and method for inspecting defects in a capacitive touch screen panel (CTSP) regardless of the shape of an ITO pattern and without using a dedicated controller chip for a CTSP in testing defects of the CTSP. The inspection apparatus according to the present invention comprises: an LC resonant unit having an LC resonant circuit coupled to the capacitance between ITO sensor electrodes of the CTSP to induce electric resonance; an OP amplifier driving unit which is connected to the LC resonant unit to oscillate the LC resonant circuit of the LC resonant unit, and which converts the waveform of a resonant frequency into square waves; a relay unit which is connected to the LC resonant unit to interconnect the LC resonant circuit and the ITO sensor electrodes of the CTSP symmetrically parallel to each other; and a microcomputer unit which is connected to the OP amplifier driving unit to drive the relay unit, and which counts the square waves outputted by the OP amplifier driving unit in order to measure a frequency and to determine whether or not there are defects in the CTSP.