发明名称 |
Nonvolatile memory devices that utilize read/write merge circuits |
摘要 |
An integrated circuit memory device includes an array of nonvolatile memory cells (e.g., variable resistance cells) having a first plurality of lines electrically coupled to memory cells therein. A read/write control circuit is provided. The read/write control circuit includes a read/write merge circuit and a column selection circuit. The read/write control circuit, which is configured to drive a selected one of the first plurality of lines with unequal write and read voltages during respective write and read operations, includes a compensating unit. This compensating unit is configured to provide a read compensation current to the selected one of the first plurality of lines circuit during the read operation.
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申请公布号 |
US7894236(B2) |
申请公布日期 |
2011.02.22 |
申请号 |
US20070945443 |
申请日期 |
2007.11.27 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
OH HYUNG-ROK;CHO WOO-YEONG;KANG SANG-BEOM;PARK JOON-MIN |
分类号 |
G11C7/00;G11C7/12 |
主分类号 |
G11C7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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