发明名称 Nonvolatile memory devices that utilize read/write merge circuits
摘要 An integrated circuit memory device includes an array of nonvolatile memory cells (e.g., variable resistance cells) having a first plurality of lines electrically coupled to memory cells therein. A read/write control circuit is provided. The read/write control circuit includes a read/write merge circuit and a column selection circuit. The read/write control circuit, which is configured to drive a selected one of the first plurality of lines with unequal write and read voltages during respective write and read operations, includes a compensating unit. This compensating unit is configured to provide a read compensation current to the selected one of the first plurality of lines circuit during the read operation.
申请公布号 US7894236(B2) 申请公布日期 2011.02.22
申请号 US20070945443 申请日期 2007.11.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 OH HYUNG-ROK;CHO WOO-YEONG;KANG SANG-BEOM;PARK JOON-MIN
分类号 G11C7/00;G11C7/12 主分类号 G11C7/00
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