发明名称 METHOD OF FORMING PATTERN, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of forming a pattern capable of simultaneously forming a plurality of minute patterns of different sizes, and a method of manufacturing a semiconductor device. SOLUTION: This method of forming a pattern includes processes of: forming a plurality of regions 1, 2 in accordance of difference of pattern sizes on a base; separating each of a plurality of block copolymers from another one of the plurality of the block copolymers and segregating the each of the plurality of the block copolymers into a corresponding one of the regions 1, 2; subjecting the block copolymers in the respective regions 1, 2 to phase separation; and selectively removing a specific phase in the respective block copolymers subjected to phase separation and forming patterns of the block copolymers different in pattern size for each of the respective regions 1, 2. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011035233(A) 申请公布日期 2011.02.17
申请号 JP20090181332 申请日期 2009.08.04
申请人 TOSHIBA CORP 发明人 MATSUNAGA KENTARO;ORI TOMOYA;SHIOBARA HIDESHI;SATO SACHIKO;KAWAMURA YOSHIHISA
分类号 H01L21/027 主分类号 H01L21/027
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