| 摘要 |
1487095 Testing relays SIEMENS A G 17 Sept 1974 [19 Sept 1973 (3)] 40404/74 Heading G1U A relay testing apparatus comprises a high frequency pulse generator G driving a counter Z via a gating circuit T to measure time intervals, the gate T being opened and closed by outputs from an analyzer A connected to the relay contacts a, r, u, fu. The analyzer produces pulses at appropriate times to measure the bounce time of a single contact i.e. time between first operation and finally reaching new state; the switching time of changeover or make-before-break contacts i.e. first operation of first contact to be actuated to the second contact finally achieving its new state; transit time which is the time between the last bounce of the first contact actuated and the first bounce of the second contact. A time filter F may be optionally used to suppress short duration bounces. The counter output is read-out to a store S for indication or quality control. |
