发明名称 Semiconductor devices including interlayer conductive contacts and methods of forming the same
摘要 In a semiconductor device and a method of forming the same, the semiconductor device comprises: a first insulating layer on an underlying contact region of the semiconductor device, the first insulating layer having an upper surface; a first conductive pattern in a first opening through the first insulating layer, an upper portion of the first conductive pattern being of a first width, an upper surface of the first conductive pattern being recessed relative to the upper surface of the first insulating layer so that the upper surface of the first conductive pattern has a height relative to the underlying contact region that is less than a height of the upper surface of the first insulating layer relative to the underlying contact region; and a second conductive pattern contacting the upper surface of the first conductive pattern, a lower portion of the second conductive pattern being of a second width that is less than the first width.
申请公布号 US7888798(B2) 申请公布日期 2011.02.15
申请号 US20080080284 申请日期 2008.04.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HONG JONGWON;SEONG GEUMJUNG;LEE JONGMYEONG;LEE HYUNBAE;CHOI BONGHYUN
分类号 H01L23/48;H01L23/52;H01L29/40 主分类号 H01L23/48
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