| 摘要 |
A circuit for detecting attacks by contacting an integrated circuit chip comprising means for applying a random signal to a first terminal of at least one conductive path formed in at least one first metallization level of the chip, means for comparing the applied signal with a signal present on a second terminal of the path, and means for delaying the comparison time with respect to the application time, of a duration longer than or equal to the propagation delay through the first path.
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