发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to prevent the property deterioration of a semiconductor device due to the oxidation of a diffusion preventing film by forming an oxidation preventing film which surrounds the sidewall of the diffusion preventing film. CONSTITUTION: A first conductive film(20) is formed. A diffusion preventing film(21A) is formed on the first conductive film. The sidewall of the diffusion preventing film is partially etched. An oxidation preventing film(23) surrounding the diffusion preventing film is formed in the etched region. A second conductive film is formed on the diffusion preventing film and the oxidation preventing film.
申请公布号 KR20110015234(A) 申请公布日期 2011.02.15
申请号 KR20090072852 申请日期 2009.08.07
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KANG, DONG KYUN
分类号 H01L21/24;H01L21/28 主分类号 H01L21/24
代理机构 代理人
主权项
地址