发明名称 PHOTOMASK
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a photomask with which transmitted light quantity distribution can be finely controlled. <P>SOLUTION: The photomask has: a substrate; and a mask pattern layer which is formed on the substrate and has a microdot pattern not resolving in an exposure wavelength. The photomask controls the transmitted light quantity distribution at exposure based on the distribution state of the dot pattern, which are constituted using regular phase transmission, shading and antiphase transmission. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011028233(A) 申请公布日期 2011.02.10
申请号 JP20100134082 申请日期 2010.06.11
申请人 DAINIPPON PRINTING CO LTD 发明人 ABE MAKOTO
分类号 G03F1/29;G03F1/30;G03F1/54 主分类号 G03F1/29
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