发明名称 |
LITHOGRAPHIC APPARATUS HAVING CONTAMINANT TRAPPING SYSTEM, CONTAMINANT TRAPPING SYSTEM, DEVICE MANUFACTURING METHOD, AND METHOD FOR TRAPPING OF CONTAMINANTS IN LITHOGRAPHIC APPARATUS |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a lithographic apparatus that has an illumination system including a contaminant trapping system with improved efficiency as compared with conventional contaminant trapping systems. <P>SOLUTION: The lithographic apparatus includes an illumination system for adjusting a radiation beam emitted substantially from a light emitting point LEP. The illumination system includes the contaminant trapping system CTS. The trapping system includes a contaminant trap CT having a central zone CZ and a peripheral zone PZ. The trap includes a plurality of platelets Pt that extend substantially outward through the peripheral zone. The light emitting point LEP exists on a plane where the platelets Pt overlap therewith. Each of the platelets Pt has a normal with respect to a component directed towards the central zone. <P>COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2011029653(A) |
申请公布日期 |
2011.02.10 |
申请号 |
JP20100211817 |
申请日期 |
2010.09.22 |
申请人 |
ASML NETHERLANDS BV |
发明人 |
BAKKER LEVINUS P;BANINE VADIM YEVGENYEVICH;WASSINK ARNOUD CORNELIS |
分类号 |
H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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