| 摘要 |
PURPOSE: A method for inspecting an organic electro luminescent device and a method for inspecting an organic electro luminescent device are provided to improve luminous efficiency and stably supply a lot of the organic electro luminescent device with stable performance by nondestructively inspecting the performance of the organic electro luminescent device. CONSTITUTION: The shape of a first M plot is obtained by applying a voltage below a light emission initializing voltage to a reference organic electro luminescent device through an impedance spectrum method within a frequency range of 0.1 mHz to 1 MHz. The shape of a second M plot is obtained by applying the voltage below the light emission initializing voltage to the organic electro luminescent device of a target through the impedance spectrum method within a frequency range of 0.1 mHz to 1 MHz. The shapes of the first and second M plots are compared. The shape of the M plot includes an arc part(21), a curved part(23) and the combined shape thereof. |
