发明名称 X-RAY METERING APPARATUS, AND X-RAY METERING METHOD
摘要 An X-ray waveform is generated by validating detection data corresponding to when an X-ray (4) is generated at a collision point (9) among X-ray detection data and invalidating other data. For example, when laser light (3) is pulse laser light and an electron beam (1) is a continuous electron beam or a pulse-like electron beam having a pulse width equal to or greater than that of the pulse laser light, the X-ray waveform is generated by detecting the laser light (3) and multiplying the X-ray detection data by laser light detection data after making time axes coincident with respect to the collision point (9).
申请公布号 US2011026679(A1) 申请公布日期 2011.02.03
申请号 US20080667500 申请日期 2008.07.01
申请人 IHI CORPORATION;THE UNIVERSITY OF TOKYO 发明人 NOSE HIROYUKI;ISHIDA DAISUKE;KANEKO NAMIO;SAKAI YASUO;UESAKA MITSURU;SAKAMOTO FUMITO;DOBASHI KATSUHIRO
分类号 H05G2/00 主分类号 H05G2/00
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