发明名称 |
X-RAY METERING APPARATUS, AND X-RAY METERING METHOD |
摘要 |
An X-ray waveform is generated by validating detection data corresponding to when an X-ray (4) is generated at a collision point (9) among X-ray detection data and invalidating other data. For example, when laser light (3) is pulse laser light and an electron beam (1) is a continuous electron beam or a pulse-like electron beam having a pulse width equal to or greater than that of the pulse laser light, the X-ray waveform is generated by detecting the laser light (3) and multiplying the X-ray detection data by laser light detection data after making time axes coincident with respect to the collision point (9).
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申请公布号 |
US2011026679(A1) |
申请公布日期 |
2011.02.03 |
申请号 |
US20080667500 |
申请日期 |
2008.07.01 |
申请人 |
IHI CORPORATION;THE UNIVERSITY OF TOKYO |
发明人 |
NOSE HIROYUKI;ISHIDA DAISUKE;KANEKO NAMIO;SAKAI YASUO;UESAKA MITSURU;SAKAMOTO FUMITO;DOBASHI KATSUHIRO |
分类号 |
H05G2/00 |
主分类号 |
H05G2/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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