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发明名称
PROBE UNIT AND INSPECTION HEAD USING THE SAME
摘要
申请公布号
JPH10160760(A)
申请公布日期
1998.06.19
申请号
JP19960337671
申请日期
1996.12.04
申请人
MICRONICS JAPAN CO LTD
发明人
HASEGAWA YOSHIE
分类号
G01R31/26;G01R1/073;H01L21/66;(IPC1-7):G01R1/073
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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