| 摘要 |
An apparatus for the absolute measurement of two dimensional optical path distributions comprises: a broadband light source for illuminating an object; an interferometer for forming an image of at least part of the object, which image comprises a broadband interferogram; a hyperspectral imager in optical communication with the interferometer for spectrally separating the broadband interferogram into a plurality of narrowband two dimensional interferograms; a register for spatially registering the narrowband interferograms; an extractor for extracting one dimensional intensity signals from corresponding pixels in each narrowband interferogram; a calculator for calculating the frequency for each point on the object from a one dimensional intensity signal associated with that point. The frequency for each pixel is proportional to the optical path difference at that pixel; the optical path distribution may thus be deduced. Example applications include optical component testing, displacement field measurement using speckle interferometry, profilometry of small scale mechanical and electronic devices, measuring three dimensional profiles and optical coherence tomography. |
