发明名称 Electric ultimate defects analyzer detecting all defects in PCB/MCM
摘要 A method and a system of testing electronic components assemblies, each assembly comprising a multiplicity of tracks, each connecting a multiplicity of ports. The system may enable applying heat energy upon at least one part of the at least one track; measuring energy diffusion within a predefined time interval of the heated part of the track; calculating at least one distribution energy diffusion profile associated according to the measured diffusion, where the profile represents the diffusion of energy versus time; and identifying defects in the at least one track, according to the analysis of the diffusion profile.
申请公布号 US7877217(B2) 申请公布日期 2011.01.25
申请号 US20080332879 申请日期 2008.12.11
申请人 INVISIBLE LTD. 发明人 DANKNER YAIR
分类号 G01R31/00;G06F19/00 主分类号 G01R31/00
代理机构 代理人
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