发明名称 TESTING METHOD FOR ELECTRONIC APPARATUS
摘要 An electronic apparatus includes a first power contact, a second power contact, and a control unit. The first power contact is electrically connected with an anode of a power supply source, and the second power contact is electrically connected with a cathode of the power supply source. The control unit electrically connects the first power contact and the second power contact for forming a signal transmission path and receiving the power generated by the power supply source. When the control unit is operated in a testing mode, the control unit operates in a working mode or a sleeping mode according to an instruction of a default instruction set for changing a current waveform signal transmitted over the signal transmission path, so as to achieve the purpose of providing a convenient and high-efficiency testing.
申请公布号 US2011012611(A1) 申请公布日期 2011.01.20
申请号 US20090625865 申请日期 2009.11.25
申请人 SILITEK ELECTRONIC (GUANGZHOU) CO., LTD.;LITE-ON TECHNOLOGY CORPORATION 发明人 YEN TAO-CHENG
分类号 G01R31/02 主分类号 G01R31/02
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