发明名称 APPARATUS FOR MEASURING DIMENSIONS OF TEST PIECE
摘要 PROBLEM TO BE SOLVED: To provide an apparatus for measuring a dimension, capable of accurately setting a position of a test piece and measuring the dimension of the test piece with high accuracy.SOLUTION: The apparatus includes a pair of conveyors 11 for conveying the test piece 1 so as to support its both ends from the lower side; a width measuring mechanism 3 for optically measuring a width of the test piece 1 by photographing the test piece 1 conveyed by the conveyors 11; a thickness measuring mechanism 4 for measuring the thickness in the vertical direction, by vertically sandwiching the test piece 1 conveyed by the conveyors 11; and a contact block 6, which is disposed on a conveying path of the test piece 1 formed by the conveyors 11 and is abuttable against both the end parts of the test piece 1.
申请公布号 JP2011013061(A) 申请公布日期 2011.01.20
申请号 JP20090156543 申请日期 2009.07.01
申请人 SHIMADZU CORP 发明人 MATSUMOTO EIJI
分类号 G01N3/08;G01B11/02;G01B21/00 主分类号 G01N3/08
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