发明名称 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD OF FORMING PATTERN USING THE COMPOSITION
摘要 PROBLEM TO BE SOLVED: To provide an actinic-ray- or radiation-sensitive resin composition that is satisfactory with respect to high sensitivity, high resolution of a dense pattern and an isolated line, sufficient exposure latitude, proper line width roughness, proper bridge margin and high resolution of isolated space, and to provide a method for forming a pattern using the composition.SOLUTION: The actinic-ray- or radiation-sensitive resin composition includes a resin (A), whose solubility in an alkali developer is increased by the action of an acid; the resin containing a monocyclic acid-dissociable cycloalkyl (meth)acrylate unit having 5 to 8 carbon atoms and a substituted styrene unit; and a compound (B) which, when exposed to actinic rays or radiation, generates sulfonic acid having a structure of an aromatic ring that has a substituent, including a hydrocarbon group having 3 or more carbon atoms.
申请公布号 JP2011013671(A) 申请公布日期 2011.01.20
申请号 JP20100126995 申请日期 2010.06.02
申请人 FUJIFILM CORP 发明人 DOBASHI TORU;TSUBAKI HIDEAKI;SHIRAKAWA KOJI;TAKAHASHI HIDETOMO;TSUCHIMURA TOMOTAKA
分类号 G03F7/004;C08F212/14;C08F220/16;G03F7/039;H01L21/027 主分类号 G03F7/004
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