发明名称 Mask and method of fabricating a polysilicon layer using the same
摘要 A mask includes a primary opaque pattern and a number of clusters of secondary opaque patterns. The primary opaque pattern defines a number of strip transparent slits whose extending directions are substantially the same. The clusters of the secondary opaque patterns are connected to the primary opaque pattern, and each of the clusters of the secondary opaque patterns is disposed in one of the transparent slits, respectively. Each of the clusters of the secondary opaque patterns includes a number of secondary opaque patterns, and extending directions of at least a portion of the secondary opaque patterns and the extending directions of the transparent slits together form included angles that are not equal to about 90°.
申请公布号 US7871907(B2) 申请公布日期 2011.01.18
申请号 US20080235555 申请日期 2008.09.22
申请人 AU OPTRONICS CORPORATION 发明人 SUN MING-WEI
分类号 H01L21/20 主分类号 H01L21/20
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