| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of detecting failures in all paths of the semiconductor integrated circuit, while reducing the number of their external terminals, and to provide an electronic apparatus.SOLUTION: A third FF circuit 13 outputs third hold data Dm3 of an LL level or H level from its output terminal Q, in accordance with a test pattern input from the scan-in terminal S1 of a first FF circuit 11. A selection circuit 23 outputs first processed data Dp1 which passes through a path A or second hold data Dm2 which passes through a path B, as selected data De to a second logic circuit 21, in accordance with the third hold data Dm3 input from the output terminal Q of the third FF circuit 13. |
