| 摘要 |
FIELD: measurement technology.SUBSTANCE: invention relates to the field of thermophysical measurements and can be used for measuring thermal diffusivity of thin layers of materials. Disclosed is method of determining thermal diffusivity of thin layers of materials, including pulse heat action on surface of flat sample and recording of dependence of temperature of specimen surface, opposite subjected to heating, from time from beginning of heat effect with subsequent calculation of thermal diffusivity. Heat pulse acts on circular periphery area of specimen surface. Recording time for achieving half of maximum temperature in centre of sample with subsequent calculation of values of thermal diffusivity by formula:=K/τ, where τis time for achieving half of maximum temperature in centre of sample; K is coefficient, which does not depend on sample material and its thickness, calculated by formula: K=τ·, where τis time for achieving half of maximum temperature in centre of sample with known value of heat diffusivity of.EFFECT: high accuracy of measuring thermal diffusivity of thin layers of materials.1 cl, 3 dwg |
