发明名称 METHOD OF ON-CHIP CURRENT MEASUREMENT AND SEMICONDUCTOR IC
摘要 A semiconductor integrated circuit is constituted to include a circuit block having a predetermined function, a power switch capable of supplying an operating power to the circuit block, and a current measuring circuit for obtaining a current flowing to the circuit block based on a voltage between terminals of the power switch in a state in which the power switch is turned on and an on-resistance of the power switch. The current flowing to the circuit block is obtained based on the voltage between terminals of the power switch in the state in which the power switch is turned on and the on-resistance of the power switch. Thus, it is possible to measure a current of the circuit block in a state in which a chip is normally operated.
申请公布号 US2011006792(A1) 申请公布日期 2011.01.13
申请号 US20100878564 申请日期 2010.09.09
申请人 RENESAS ELECTRONICS CORPORATION 发明人 OTSUGA KAZUO;YAMADA TETSUYA;OSADA KENICHI;KANNO YUSUKE
分类号 G01R31/3187 主分类号 G01R31/3187
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