| 摘要 |
PROBLEM TO BE SOLVED: To measure amounts out of alignment between semiconductor elements in a sub scanning direction when semiconductor elements that have an image sensor are arranged in a main scanning direction and placed into a holder.SOLUTION: A sensor chip 231 that is a semiconductor element has a pixel group 232 in which a plurality of pixels that are photoelectric conversion elements are arranged along to the sub scanning direction. The plurality of sensor chips 231 are arranged along to the main scanning direction and placed into the holder, and consist of a light source and a line sensor part. A reference measurement image is compared with a measurement image that is read by the line sensor part, and then the amount of misalignment for the sensor chips 231 is measured. In image reading processing to read normal images, a controller generates image information which indicates an image that each pixel group 232 are expressed using dots of a minimum unit based on electric signals related to representative pixels selected according to the measured amount of misalignment. |
