发明名称 Phase change memory device and fabricating method therefor
摘要 A phase change memory device and fabricating method are provided. A disk-shaped phase change layer is buried within the insulating material. A center via and ring via are formed by a lithography. The center via is located in the center of the phase change layer and passes through the phase change layer, and the ring via takes the center via as a center. A heating electrode within the center via performs Joule heating of the phase change layer, and the contact area between the phase change layer and the heating electrode is reduced by controlling the thickness of the phase change layer. Furthermore, a second electrode within the ring via dissipates the heat transmitted to the contact interface between the phase change layers, so as to avoid transmitting the heat to the etching boundary at the periphery of the phase change layer.
申请公布号 US7868314(B2) 申请公布日期 2011.01.11
申请号 US20090547744 申请日期 2009.08.26
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE 发明人 CHEN WEI-SU;CHEN YI-CHAN;WANG WEN-HAN;HSU HONG-HUI;LEE CHIEN-MIN;CHUO YEN;CHAO TE-SHENG;LEE MIN-HUNG
分类号 H01L47/00 主分类号 H01L47/00
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