发明名称 Methods of forming a contact structure
摘要 In a method of forming a contact structure, a first insulation layer including a first contact hole is formed on a substrate. A metal layer including tungsten is formed to fill the first contact hole. A planarization process is performed on the metal layer until the first insulation layer is exposed to form a first contact. A second contact is grown from the first contact. The second contact is formed without performing a photolithography process and an etching process to prevent misalignments.
申请公布号 US7867902(B2) 申请公布日期 2011.01.11
申请号 US20090499832 申请日期 2009.07.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI SUK-HUN;HONG CHANG-KI;SIM HYUN-JUN;SON YOON-HO
分类号 H01L21/44;H01L21/311;H01L21/4763 主分类号 H01L21/44
代理机构 代理人
主权项
地址