发明名称 MAGNETIC DOMAIN IMAGING SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a magnetic domain imaging system capable of applying a strong magnetic field to a specimen.SOLUTION: In the magnetic domain imaging system wherein the magnetic body specimen 3 is arranged within an upper pole of an objective lens of a transmission electron microscope and electron beams penetrating the specimen 3 can be displayed on a display means by imaging the electron beams, the magnetic domain imaging system is constituted by making a magnetic field application coil 4 for applying the magnetic field to the specimen 3, and deflection coils 9, 10 for returning the electron beams deflected with the magnetic field applied to the specimen 3 to an optical axis arrange within the upper pole of the objective lens.
申请公布号 JP2011003533(A) 申请公布日期 2011.01.06
申请号 JP20100102189 申请日期 2010.04.27
申请人 JEOL LTD 发明人 TOMITA KEN
分类号 H01J37/26 主分类号 H01J37/26
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