发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE WITH BURIED GATE
摘要 PURPOSE: A semiconductor device manufacturing method is provided to increase the margin of the contact forming process by enabling the following contact to act as the hard mask being self-aligned by forming a sealing film in protruded shape. CONSTITUTION: A semiconductor substrate(21) comprises a silicon substrate. An element separation layer(22) uses a spin-on insulation layer which has the excellent gap-fill property. The spin-on insulation layer comprises the silicon oxide film which is mainly made of the polysilazane. A pad layer(24) comprises the oxide film.
申请公布号 KR20110001721(A) 申请公布日期 2011.01.06
申请号 KR20090059382 申请日期 2009.06.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SHIN, JONG HAN;RYU, CHEOL HWI;KIM, SUNG JUN
分类号 H01L21/8242;H01L21/336 主分类号 H01L21/8242
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