发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE WITH BURIED GATE |
摘要 |
PURPOSE: A semiconductor device manufacturing method is provided to increase the margin of the contact forming process by enabling the following contact to act as the hard mask being self-aligned by forming a sealing film in protruded shape. CONSTITUTION: A semiconductor substrate(21) comprises a silicon substrate. An element separation layer(22) uses a spin-on insulation layer which has the excellent gap-fill property. The spin-on insulation layer comprises the silicon oxide film which is mainly made of the polysilazane. A pad layer(24) comprises the oxide film.
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申请公布号 |
KR20110001721(A) |
申请公布日期 |
2011.01.06 |
申请号 |
KR20090059382 |
申请日期 |
2009.06.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
SHIN, JONG HAN;RYU, CHEOL HWI;KIM, SUNG JUN |
分类号 |
H01L21/8242;H01L21/336 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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