发明名称 METHOD OF THE DOUBLE SIDED POLISHING OF A SEMICONDUCTOR WAFER
摘要 PURPOSE: A double sided polishing method of a semiconductor wafer is provided to polish the back of a semiconductor wafer using a polishing pad without the abrasive while polishing the front of the semiconductor using the polishing pad. CONSTITUTION: The front side of the semiconductor wafer is polished by using the polishing pad having fixed abrasive. The back of the semiconductor wafer is polished using the polishing pad without the abrasive. The polishing agent containing the abrasive is introduced between the back side of the semiconductor wafer and the polishing pad.
申请公布号 KR20100138736(A) 申请公布日期 2010.12.31
申请号 KR20100033894 申请日期 2010.04.13
申请人 SILTRONIC AG 发明人 SCHWANDNER JUERGEN
分类号 H01L21/304;B24B37/08 主分类号 H01L21/304
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