发明名称 Assessing biometric sample quality using wavelets and a boosted classifier
摘要 A biometric sample training device, a biometric sample quality assessment device, a biometric fusion recognition device, an integrated biometric fusion recognition system and example processes in which each may be used are described. Wavelets and a boosted classifier are used to assess the quality of biometric samples, such as facial images. The described biometric sample quality assessment approach provides accurate and reliable quality assessment values that are robust to various degradation factors, e.g., such as pose, illumination, and lighting in facial image biometric samples. The quality assessment values allow biometric samples of different sample types to be combined to support complex recognition techniques used by, for example, biometric fusion devices, resulting in improved accuracy and robustness in both biometric authentication and biometric recognition.
申请公布号 GB201019573(D0) 申请公布日期 2010.12.29
申请号 GB20100019573 申请日期 2009.06.29
申请人 LOCKHEED MARTIN CORPORATION 发明人
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