| 摘要 |
PROBLEM TO BE SOLVED: To provide an adhesive tape manufacturing system which quickly in-line detects the cause of a surface defect when the surface defect due to fine irregularities occurs while manufacturing the adhesive tape and can change manufacturing conditions so as to remove the cause of the surface defect. SOLUTION: The adhesive tape manufacturing system is constituted by measuring the adhesive surface on a film sheet 2 after coating by a first Fizeau interferometer 8 installed between a die 5 and a drying device 6 to obtain data on the interference fringe image of the adhesive surface, analyzing the data on the interference fringe image of the adhesive surface obtained by the first Fizeau interferometer 8 through an interference fringe analyzer 9 with the use of Fourier transform, calculating the reference numerical data of Ra (arithmetic mean roughness) and P-V (the difference between the maximum height and the minimum height) relating to the fine irregularities occurring on the adhesive surface, and changing the coating conditions of the adhesive by the die 5 through a control unit 10 on the basis of the calculated reference numerical data. COPYRIGHT: (C)2011,JPO&INPIT |
