| 摘要 |
PROBLEM TO BE SOLVED: To perform a stable test, without reducing the number of chips at one test. SOLUTION: In a method for dividing the semiconductor integrated circuit device (corresponding to S1 and S2) into a plurality of groups and testing them simultaneously, in at least one group, the semiconductor integrated circuit device is made to operate by a clock signal (corresponding to CLK1 and CLK2) of a frequency that differs from those of the other groups. COPYRIGHT: (C)2011,JPO&INPIT
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