发明名称 DYNAMIC SURFACE SHAPE MEASURING DEVICE AND DYNAMIC SURFACE SHAPE MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a dynamic surface shape measuring device and a dynamic surface shape measuring method capable of measuring a dynamic surface deformation of a movable object without using reference light during measurement. SOLUTION: This dynamic surface shape measuring device 1 mainly includes a pulsing light source 2 for emitting pulsing light with which the movable object 7 is irradiated, and a wavefront sensor 14 for measuring wavefront aberration, and detects movement of the movable object 7 by an approximately parallel light source 16, a first light receiving element 19 and a second light receiving element 20 during measurement. A signal generator allows the pulsing light source 2 to emit light at a timing when the movable object 7 performs a prescribed movement, corresponding to the detected movement. The emitted pulsing light is reflected by a surface to be measured of the movable object 7, and reflected light enters the wavefront sensor 14. The wavefront aberration of the reflected light is measured by the wavefront sensor 14, and a dynamic surface shape of the surface to be measured is measured from the wavefront aberration of a difference with a reference wavefront. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010286434(A) 申请公布日期 2010.12.24
申请号 JP20090142113 申请日期 2009.06.15
申请人 BROTHER IND LTD 发明人 OMINATO HIROYUKI;FUJINO HITOSHI
分类号 G01M11/00 主分类号 G01M11/00
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