发明名称 SILICON WAFER AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To secure sufficient gettering capability even when a device is made thinner and to prevent injection atoms from affecting a device active layer and deteriorating device characteristics. SOLUTION: A method of manufacturing a silicon wafer includes: an injection step; and an injection peak layer removal step of removing an injection peak layer from the surface of the wafer up to a peak layer including a peak position where the concentration of injection elements injected is at its peak in the direction of wafer thickness and containing 50-98% of the injection element. A gettering layer is formed which has the peak of the gettering capability corresponding to a depth position deeper than the peak position of the concentration of the injection element. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010283022(A) 申请公布日期 2010.12.16
申请号 JP20090133179 申请日期 2009.06.02
申请人 SUMCO CORP 发明人 TORIGOE KAZUNAO;ADACHI HISASHI;ASAYAMA HIDEKAZU;MOTOYAMA TAMIO;NAGABUCHI AKIRA
分类号 H01L21/322;H01L21/02;H01L27/12 主分类号 H01L21/322
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