发明名称 |
SILICON WAFER AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To secure sufficient gettering capability even when a device is made thinner and to prevent injection atoms from affecting a device active layer and deteriorating device characteristics. SOLUTION: A method of manufacturing a silicon wafer includes: an injection step; and an injection peak layer removal step of removing an injection peak layer from the surface of the wafer up to a peak layer including a peak position where the concentration of injection elements injected is at its peak in the direction of wafer thickness and containing 50-98% of the injection element. A gettering layer is formed which has the peak of the gettering capability corresponding to a depth position deeper than the peak position of the concentration of the injection element. COPYRIGHT: (C)2011,JPO&INPIT
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申请公布号 |
JP2010283022(A) |
申请公布日期 |
2010.12.16 |
申请号 |
JP20090133179 |
申请日期 |
2009.06.02 |
申请人 |
SUMCO CORP |
发明人 |
TORIGOE KAZUNAO;ADACHI HISASHI;ASAYAMA HIDEKAZU;MOTOYAMA TAMIO;NAGABUCHI AKIRA |
分类号 |
H01L21/322;H01L21/02;H01L27/12 |
主分类号 |
H01L21/322 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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