发明名称 APPARATUS FOR MEASURING JITTER TRANSFER CHARACTERISTIC
摘要 An apparatus for rapidly measuring jitter transfer characteristics is provided. A modulation signal generator generates a modulation signal M including a plurality of sinusoidal components having known amplitudes m1 to mn and different frequencies f1 to fn, and outputs the modulation signal M to a jitter generator. A clock signal C phase-modulated by the modulation signal M is input to a data signal generator, a data signal D synchronized with the clock signal C is provided to a measurement object, a data signal D′ output from the measurement object is input to a clock recovery unit to recover a clock signal component C′, and the clock signal component C′ is phase-detected by a phase detector. A signal amplitude detector detects the amplitudes of the plurality of sinusoidal components included in the modulation signal M from an output signal M′ of the phase detector, and an operation processor calculates a ratio of the detected amplitudes and the known amplitudes for each of the sinusoidal components, respectively.
申请公布号 US2010316105(A1) 申请公布日期 2010.12.16
申请号 US20100691376 申请日期 2010.01.21
申请人 ANRITSU CORPORATION 发明人 SUZUKI SEIYA;AOKI TAKASHI;MOCHIZUKI KEN
分类号 H04B17/00 主分类号 H04B17/00
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