首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
Probe card for testing wafer
摘要
申请公布号
KR100998326(B1)
申请公布日期
2010.12.03
申请号
KR20080052181
申请日期
2008.06.03
申请人
发明人
分类号
H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
您可能感兴趣的专利
NIB MADE OF FIBER
FILE
RIBBONED BOOKMARK
MANUFACTURING METHOD FOR WRITING PAPER HAVING BINDING FUNCTION
INKJET RECORDING HEAD AND ITS MANUFACTURING METHOD
INKJET RECORDING HEAD AND INKJET RECORDER
FOAMED LAMINATED SHEET OF ANTISTATIC POLYPROPYLENE RESIN AND PACKAGING MOLDING
CONDUCTIVE FILM AND MANUFACTURING METHOD OF CONDUCTIVE FILM
LAMINATED FOR PACKAGING
APPARATUS FOR SUPPORTING OPERATION OF INJECTION MOLDING MACHINE
DOPE CASTING DIE
METHOD AND EQUIPMENT FOR CELL PRODUCTION, AND WORKING TRUCK FOR CELL PRODUCTION
VICE
METHOD AND DEVICE FOR CUTTING OUTER PERIPHERY OF HOLLOW BODY
METHOD OF FIXING AND MACHINING WORKPIECE
L-SHAPED WRENCH MANUFACTURING METHOD
UNPLATED SOLID WIRE FOR CO2 GAS SHIELDED ARC WELDING
CASTING APPARATUS
ROLL FORMING METHOD AND APPARATUS
APPARATUS FOR PHOTOCATALYTIC REACTION