发明名称 |
HIGH-PRECISION ABSOLUTE MICROWAVE TELEMETER WITH A MULTI-STATE REFLECTION DEVICE |
摘要 |
<p>The present invention relates to a system for measuring the distance between an antenna (111) and a reflector (112), including a transmission/reception module (140), a measurement means (160) for measuring a parameter equal to the complex ratio between the wave received and transmitted by said transmission/reception module for a plurality of frequencies, as well as a calculation means (170) for calculating an inverse Fourier transform of said parameter and measuring the time position of a spike in the corresponding impulse response. A first time position of a spike is measured in a differential impulse response between first and second radio statuses of the reflector. A second time position corresponding to the reflection on the antenna is also measured, and the distance is obtained from the first and second time positions.</p> |
申请公布号 |
WO2010136461(A1) |
申请公布日期 |
2010.12.02 |
申请号 |
WO2010EP57178 |
申请日期 |
2010.05.25 |
申请人 |
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIESALTERNATIVES;BERISSET, PHILIPPE |
发明人 |
BERISSET, PHILIPPE |
分类号 |
G01S7/288;G01S7/41;G01S13/75;G01S13/76;G01S13/88 |
主分类号 |
G01S7/288 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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