| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a technique for correcting white defects caused by defective pixels of solid-state imaging elements without sharply losing reproducibility of subjects in captured images. <P>SOLUTION: When the solid-state imaging element is shielded from light and images are captured for fixed exposure time, it is determined whether a target pixel is a defective pixel appearing as a white defect in the captured image according to a difference between an average of a pixel value of a peripheral pixel of the target pixel and a pixel value of the target pixel with each of a plurality of pixels of the solid-state imaging element as the target pixel. Then, when the target pixel is a defective pixel, position information is stored, which indicates the position of the target pixel on the imaging surface of the solid-state imaging element. Contrarily, when images are captured with exposure time designated by a user, the original pixel values of the defective pixels are replaced by a weighted average value between an average value of pixel values of peripheral pixels of the defective pixels and the original pixel values of the defective pixels to correct the pixel values of the defective pixels wherein the weighted averaging is carried out at a ratio (the longer the exposure time is, the higher the ratio of the average value of the pixel values of the peripheral pixels of the defective pixels is) according to the exposure time. <P>COPYRIGHT: (C)2011,JPO&INPIT |
