发明名称 SEMICONDUCTOR MEMORY DEVICE AND METHOD OF FABRICATING THE SAME
摘要 <p>PURPOSE: A semiconductor memory device and a manufacturing method thereof are provided to form a bit line contact with a fine pattern by using a sidewall pattern transfer process. CONSTITUTION: A semiconductor substrate(1) has an active region divided by a device isolation region. A plurality of laminated gate type memory cell transistors(4) are serially connected on the active region. Selection transistors(6a,6b) are connected to both ends of the plurality of memory cell transistors on the active region. A bit line contact(8) is connected to the drain region which belongs to the selection transistor on the active region.</p>
申请公布号 KR20100125172(A) 申请公布日期 2010.11.30
申请号 KR20100020716 申请日期 2010.03.09
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 NAGASHIMA SATOSHI;ARAI FUMITAKA;MEGURO HISATAKA;AKAHORI HIROSHI
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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