发明名称 Charged particle detector assembly, charged particle beam apparatus and method for generating an image
摘要 A charged particle detector assembly comprises a particle detector, which has at least one particle sensitive region for detecting at least a portion of the spatial distribution of charged particles and for generating a two-dimensional optical signal which correlates to the detected spatial distribution. Further, an image conduit has an input coupled to the particle sensitive region of the particle detector for transmitting the two-dimensional optical signal to at least one optical detector. Further, a selecting means is adapted for selecting at least a portion of the two-dimensional optical signal.
申请公布号 US7842930(B2) 申请公布日期 2010.11.30
申请号 US20070923421 申请日期 2007.10.24
申请人 ICT INTEGRATED CIRCUIT TESTING GESELLSCHAFT FUER HALBLEITERPRUFTECHNIK MBH 发明人 ALMOGY GILAD;SHEMESH DROR;ADAMEC PAVEL
分类号 H01J37/28 主分类号 H01J37/28
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