| 摘要 |
PURPOSE: A fuse circuit for a semiconductor device and a method of monitoring a fuse are provided to limit the usage of a fuse set unit by detecting a fuse set unit in which a defective fuse is included in the device. CONSTITUTION: A plurality of fuse set units(401~406) compares address information. The address information is programmed in response to address and fuse cutting state. A test controller(410) consecutively enables the plural fuse set units. The fuse set unit comprises an enable fuse unit(41), an address fuse unit(42), and a signal combination unit(43). The enable fuse unit outputs the enable signal. The address fuse unit compares the address information and the address bit signal. The signal combination unit combines a plurality of comparison result signals. |
