| 摘要 |
A probe card includes a printed circuit board; at least one probe substrate including a probe substrate body disposed on the printed circuit board and at least one probe through hole extending by passing through the probe substrate body; and at least one probe including a probe body supported by the probe substrate and a probe lead part extending from the probe body to an inside of the probe through hole in the printed circuit board, wherein the probe substrate body includes at least one fixing slit which extends in an X axis direction at one side surface of the probe substrate body where the probe body is exposed, and has a width substantially equal to a thickness of the probe; and at least some of the probe bodies are received in the fixing slit so that the probes are arranged in the a Y axis direction. |
