| 摘要 |
PROBLEM TO BE SOLVED: To provide a jig for a tamping test adaptable to an existing apparatus when a sample is tamped while equally pressed, having high general-purpose properties, capable of preventing the scattering of the sample and capable of stably molding a sample, and to provide a method of preparing the sample for the tamping test. SOLUTION: The jig for the tamping test is constituted so as to press the upper part of the granular sample S when the sample for the tamping test is prepared by supplying the granular sample S into a mold and allowing a rammer 52 to fall into the mold to tamp the sample S to thereby prepare the sample for the tamping test. This jig includes a pressing surface for equally pressing the whole upper part of the sample S by allowing the rammer 52 to fall on the central or periphery of the upper part of the sample S corresponding to the whole upper surface of the sample S by a block-like body independent of the rammer 52 to tamp the sample S. COPYRIGHT: (C)2011,JPO&INPIT
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