An interferometer for generating an interference pattern comprises a lamellar grating unit (5) having reflection surfaces for reflecting light, a light emitter (1) for emitting light to the lamellar grating unit (5), and a light receiver (2) for receiving light reflected by the lamellar grating unit (5). The light emitter (1) comprises a plurality of individual light guides (110), which are arranged in at least one light guide row (111) and send light to the lamellar grating unit (5) in the form of a beam of rays. The beam of rays can be aimed directly at the lamellar grating unit (5). The interferometer according to the invention and the spectrometer using said interferometer enable the evaluation of a relatively large amount of light and therefore exhibit increased sensitivity.
