发明名称 DARK FIELD MICROSCOPE AND METHOD FOR DETECTING SCATTERED LIGHT USING THE SAME
摘要 PURPOSE: The darkfield microscope and scattered light detecting method using the same prevents the distortion of the polarizing component due to the refraction by the objective lens. CONSTITUTION: The light source(21) examines the incident beam. The objective lens(25) comprises the first area and the second part that surrounds first area. The scattered beam scattered from the specimen is spread. The receiver(27) transfers the scattered light passing through the objective lens.
申请公布号 KR20100123256(A) 申请公布日期 2010.11.24
申请号 KR20090042383 申请日期 2009.05.15
申请人 KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 LEE, TAEK SUNG;KIM, WON MOK;LEE, KYEONG SEOK;KIM, JOO YOUNG
分类号 G02B21/02;G01J3/44;G02B5/00 主分类号 G02B21/02
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